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TEM Sample Preparation of Thin Films of Steel
WANG Chun-fang,LI Nan,LI Ling-xia,ZHAO Xiao-li,LI Ji-kang
Department for Structural Materials, Central Iron and Steel Research Institute, Beijing 100081, China
ժҪ ���������(Transimission Electron Microscope,TEM)��Ĥ��Ʒ���Ʊ�������TEM�۲��зdz���Ҫ���ܽ��˸�������TEM��Ʒ�Ʊ������е�һЩ���飬���ڲ���˫�����ⷽ���Ʊ���Ч��������ĸ���TEM��Ʒ�����õ��˫����������Ӽ������Ͽ��Գɹ��Ʊ���TEM��Ĥ��Ʒ��
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Abstract ��The quality of the TEM (transimission electron microscop) sample of thin films has great effect on TEM observation. Several experiences about TEM sample preparation for thin films of steel were summarized. Some TEM sample is unsuccessful use of twin-jet electropolishing method and it can be obtained satisfactory by uniting twin-jet electropolishing and ion milling method.
Key words ��
steel
TEM twin-jet
electropolishing
ion millling
�ո�����: 2012-03-22
��������: 2013-02-04
��������: 973��Ŀ�������ֵܸ���֯���������뼼�������о��� ��
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E-mail: grant_wu@163.com
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2013, Vol. 31 
