Development and application of the creep test technology in Baosteel

LAI Zhang-yi，ZHOU Ye-dong，FANG Jian

Physics Examination and Testing ›› 2017, Vol. 35 ›› Issue (4) : 47-51.

Physics Examination and Testing ›› 2017, Vol. 35 ›› Issue (4) : 47-51. DOI: 10.13228/j.boyuan.issn1001-0777.20170006
Subject Discussion

Development and application of the creep test technology in Baosteel

    {{javascript:window.custom_author_en_index=0;}}
  • {{article.zuoZhe_EN}}
Author information +
History +

HeighLight

{{article.keyPoints_en}}

Abstract

{{article.zhaiyao_en}}

Key words

QR code of this article

Cite this article

EndNote

Ris (Procite)

Bibtex

Download Citations
{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2017, 35(4): 47-51 https://doi.org/10.13228/j.boyuan.issn1001-0777.20170006

References

List( Publishing order | Descend order by publishing year | Descend order by cited within ) Chart analysis

References

{{article.reference}}

Funding

RIGHTS & PERMISSIONS

{{article.copyrightStatement_en}}
{{article.copyrightLicense_en}}

Accesses

Citation

Detail
Sections
Recommended
Copyright © Physics Examination and Testing, All Rights Reserved.
Tel: 010-62182617　
E-mail：wuliceshi@163.com
Powered by Beijing Magtech Co. Ltd,.

/

〈 〉