Causes and countermeasures of the ultra sonic testing defect in Q500q

FENG Lu-lu， LU Zheng-hong， JIANG Quan-xin， XIONG Jie

Physics Examination and Testing ›› 2018, Vol. 36 ›› Issue (1) : 51-54.

Physics Examination and Testing ›› 2018, Vol. 36 ›› Issue (1) : 51-54. DOI: 10.13228/j.boyuan.issn1001-0777.20170035
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Causes and countermeasures of the ultra sonic testing defect in Q500q

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2018, 36(1): 51-54 https://doi.org/10.13228/j.boyuan.issn1001-0777.20170035

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