Cause analysis and improvement measures of white line defect on tinplate surface

LIU Lan-xiao， WANG Lin， WU Nai， ZHOU Na， WANG Lun， XU Ke-hao

Physics Examination and Testing ›› 2020, Vol. 38 ›› Issue (1) : 41.

Physics Examination and Testing ›› 2020, Vol. 38 ›› Issue (1) : 41. DOI: 10.13228/j.boyuan.issn1001-0777.20190013

Cause analysis and improvement measures of white line defect on tinplate surface

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2020, 38(1): 41 https://doi.org/10.13228/j.boyuan.issn1001-0777.20190013

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