Application of X-ray photoelectron spectroscopy in analysis of passivation film of tinplate

WANG Yaqing, ZHANG Lixia, SHI Xuexing

Physics Examination and Testing ›› 2024, Vol. 42 ›› Issue (5) : 22-26.

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Physics Examination and Testing ›› 2024, Vol. 42 ›› Issue (5) : 22-26. DOI: 10.13228/j.boyuan.issn1001-0777.20230112
Measuring Technology

Application of X-ray photoelectron spectroscopy in analysis of passivation film of tinplate

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2024, 42(5): 22-26 https://doi.org/10.13228/j.boyuan.issn1001-0777.20230112

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