Discussion on material analysis assisted by scanning acoustic microscope

SHEN Haihong, YANG Bo, XIA Peng, XU Lei, ZHOU Xiangqi, ZHANG Yubin

Physics Examination and Testing ›› 2025, Vol. 43 ›› Issue (2) : 24-29.

Physics Examination and Testing ›› 2025, Vol. 43 ›› Issue (2) : 24-29. DOI: 10.13228/j.boyuan.issn1001-0777.20240025
Measuring Technology

Discussion on material analysis assisted by scanning acoustic microscope

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2025, 43(2): 24-29 https://doi.org/10.13228/j.boyuan.issn1001-0777.20240025

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