Analysis of total focusing method for ultrasonic phased array defect inspection

YANG Bo, WAN Ce, WANG Yongfeng, SHEN Haihong, XU Lei, ZHANG Jianwei

Physics Examination and Testing ›› 2025, Vol. 43 ›› Issue (2) : 38-42.

Physics Examination and Testing ›› 2025, Vol. 43 ›› Issue (2) : 38-42. DOI: 10.13228/j.boyuan.issn1001-0777.20240028
Defect Analysis

Analysis of total focusing method for ultrasonic phased array defect inspection

    {{javascript:window.custom_author_en_index=0;}}
  • {{article.zuoZhe_EN}}
Author information +
History +

HeighLight

{{article.keyPoints_en}}

Abstract

{{article.zhaiyao_en}}

Key words

QR code of this article

Cite this article

EndNote

Ris (Procite)

Bibtex

Download Citations
{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2025, 43(2): 38-42 https://doi.org/10.13228/j.boyuan.issn1001-0777.20240028

References

List( Publishing order | Descend order by publishing year | Descend order by cited within ) Chart analysis

References

{{article.reference}}

Funding

RIGHTS & PERMISSIONS

{{article.copyrightStatement_en}}
{{article.copyrightLicense_en}}

Accesses

Citation

Detail
Sections
Recommended
Copyright © Physics Examination and Testing, All Rights Reserved.
Tel: 010-62182617　
E-mail：wuliceshi@163.com
Powered by Beijing Magtech Co. Ltd,.

/

〈 〉