Analysis of total focusing method for ultrasonic phased array defect inspection

YANG Bo, WAN Ce, WANG Yongfeng, SHEN Haihong, XU Lei, ZHANG Jianwei

Physics Examination and Testing ›› 2025, Vol. 43 ›› Issue (2) : 38-42.

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Physics Examination and Testing ›› 2025, Vol. 43 ›› Issue (2) : 38-42. DOI: 10.13228/j.boyuan.issn1001-0777.20240028
Defect Analysis

Analysis of total focusing method for ultrasonic phased array defect inspection

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2025, 43(2): 38-42 https://doi.org/10.13228/j.boyuan.issn1001-0777.20240028

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