Integrated technology for high temperature creep system based on data warehouse

YU Zhengguang, JIANG Lei, YANG Jihui, ZHANG Xiaolin, CAO Hai

Physics Examination and Testing ›› 2025, Vol. 43 ›› Issue (5) : 75-79.

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Physics Examination and Testing ›› 2025, Vol. 43 ›› Issue (5) : 75-79. DOI: 10.13228/j.boyuan.issn1001-0777.20240093
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Integrated technology for high temperature creep system based on data warehouse

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2025, 43(5): 75-79 https://doi.org/10.13228/j.boyuan.issn1001-0777.20240093

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