Measurement on Specific Heat of Thin Film and High Pressure Samples by Chip Calorimeter

QIU Huangyong

Physics Examination and Testing ›› 2008, Vol. 26 ›› Issue (6) : 37-0.

Physics Examination and Testing ›› 2008, Vol. 26 ›› Issue (6) : 37-0.
测试技术

Measurement on Specific Heat of Thin Film and High Pressure Samples by Chip Calorimeter

    {{javascript:window.custom_author_en_index=0;}}
  • {{article.zuoZhe_EN}}
Author information +
History +

HeighLight

{{article.keyPoints_en}}

Abstract

{{article.zhaiyao_en}}

Key words

QR code of this article

Cite this article

EndNote

Ris (Procite)

Bibtex

Download Citations
{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2008, 26(6): 37-0

References

List( Publishing order | Descend order by publishing year | Descend order by cited within ) Chart analysis

References

{{article.reference}}

Funding

RIGHTS & PERMISSIONS

{{article.copyrightStatement_en}}
{{article.copyrightLicense_en}}

Accesses

Citation

Detail
Sections
Recommended
Copyright © Physics Examination and Testing, All Rights Reserved.
Tel: 010-62182617　
E-mail：wuliceshi@163.com
Powered by Beijing Magtech Co. Ltd,.

/

〈 〉