Measurement on Specific Heat of Thin Film and High Pressure Samples by Chip Calorimeter

QIU Huangyong

Physics Examination and Testing ›› 2008, Vol. 26 ›› Issue (6) : 37-0.

Physics Examination and Testing ›› 2008, Vol. 26 ›› Issue (6) : 37-0.
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Measurement on Specific Heat of Thin Film and High Pressure Samples by Chip Calorimeter

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Abstract

“Calorimetry on a chip” technique for measurement of specific heat of thin film and high pressure sample is introduced. This technique was developed and put into application by the Frances Hellman research group at UC Berkeley 15 years ago. However, application of this technique in our country has not been reported yet. This paper aims at familiarising researchers in our country with this technique.

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calorimetry on a chip / thermal relaxation / micromachining

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QIU Huangyong. Measurement on Specific Heat of Thin Film and High Pressure Samples by Chip Calorimeter[J]. Physics Examination and Testing, 2008, 26(6): 37-0

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