Improvement on Preparation of Sample for Metallographic Examination Less Than 10 mm in Diameter

WEI Huanjun;SUN Xiaonan;GAO Zhiping;ZHOU Yan;GAO Leilei

Physics Examination and Testing ›› 2008, Vol. 26 ›› Issue (6) : 60-0.

Physics Examination and Testing ›› 2008, Vol. 26 ›› Issue (6) : 60-0.
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Improvement on Preparation of Sample for Metallographic Examination Less Than 10 mm in Diameter

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2008, 26(6): 60-0

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