
Analysis of inclusion control levels in ultra-high purity 316L stainless steel for semiconductor equipment
GAO Zhanjiang, WENG Jianyin, LUO Hui, LUO Xuewu, XU Xiangyu, FU Jianxun
China Metallurgy ›› 2025, Vol. 35 ›› Issue (2) : 23-35.
Analysis of inclusion control levels in ultra-high purity 316L stainless steel for semiconductor equipment
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