Test and analysis of needle-like metallographic sample in micro-nano scale
YANG Xiao1, PAN Hengpei1, WANG Shining1, LI Xuefeng1,2, ZHANG Xinyao1,2, GAO Lingqing1,2
1. Luoyang Ship Material Research Institute, Luoyang 471023, China; 2. Henan Key Laboratory of Technology and Application Structural Materials for Ships and Marine Equipments, Luoyang 471023, China
Abstract:In the process of metallographic analysis, the insetting of needle-like sample in micro-nano scale will easily cause the capillary phenomenon, which leads to the limited resolution of metallographic structure. As a result, it is difficult to accurately evaluate the micro structure. The needle-like sample in micro-nano scale were treated by grinding and polishing, and then eroded with the chemical reagents. After that, the sample was placed in ethanol and acetone solution for ultrasonic treatment followed by drying with a hair dryer. The results showed that due to the low melting point and high volatility of acetone solution, the addition of ultrasonic treatment in acetone solution in the process of conventional micro-nano metallographic sample could effectively remove the residual solution between the mosaic material and the sample. The occurrence of capillary phenomenon was reduced, which could ensure the clear observation of metallographic sample as well as the effective characterization of microstructure.
杨晓, 潘恒沛, 王世宁, 李雪峰, 张欣耀, 高灵清. 微纳米级针状金相试样的测试与分析[J]. 物理测试, 2023, 41(4): 20-23.
YANG Xiao, PAN Hengpei, WANG Shining, LI Xuefeng, ZHANG Xinyao, GAO Lingqing. Test and analysis of needle-like metallographic sample in micro-nano scale. PHYSICS EXAMINATION AND TESTING, 2023, 41(4): 20-23.
Alain S, Michel N, Jacques S, et al. Effect of dynamic contact angle on capillary rise phenomena[J]. Colloids and Surfaces A,2000,161:81.
[4]
Lei X, Anna L, Jun H, et al. Wetting and capillary phenomena of water on mica[J]. J Phys Chem B,1998,102:540.
[5]
Brackbill J U, Kothe D B, Zemach C. A continuum method for modeling surface tension[J]. J Comput Phys,1992,100:335.
[6]
Aleksandr V M, Christopher J C, Donald G T. Universal solvation model based on solute electron density and on a continuum model of the solvent defined by the bulk dielectric constant and atomic surface tensions[J]. J Phys Chem B, 2009,113: 6378.
[7]
David R, Neumann A W. Contact angle patterns on low-energy surfaces[J]. Adv Colloid Interface Sci, 2014,206:46.