物理测试
 
             Home | About Journal | Editorial Board | Instruction for Authors | Subscriptions | Advertisement | Contacts Us | Chinese
PHYSICS EXAMINATION AND TESTING  2023, Vol. 41 Issue (5): 36-40    DOI: 10.13228/j.boyuan.issn1001-0777.20230055
Current Issue| Next Issue| Archive| Adv Search |
Discussion on the influence of artificial slot width on eddy current testing signal
SHAO Changlu, LIU Qiang, WANG Ping
Dong Bei Special Steel Group Co., Ltd., Dalian 116105, China

Copyright © PHYSICS EXAMINATION AND TESTING 
Supported by: Beijing Magtech